Fault-Tolerant Computing

Some Major Publications

Note: Some links will work only from CSU machines, unless you are using the proxy server through CSU Library website.

Conference Proceedings

• Int. Symp. on Software Reliability Engineering (ISSRE)
• Int. Conf. Dependable Systems and Networks (DSN)
• International Test Conference (ITC)
• Asian Test Symposium (ATS)
• Reliability and Maintainability Symp. (RAMS)
• Int. Conf. on Software Engineering (ICSE)
• Int. Symp. VLSI Design (VLSI Design)
• VLSI Test Symposium (VTS)
• Security and Privacy (S&P)
• Int. Symp. Microarchitecture (MICRO)
• Design Automation Conference (DAC)
• Int. Conference on Computer Design (ICCD)
• Int. Conf. on Computer-Aided Design (ICCAD)
• COMPSAC
• Several others depending on your areas of interest.

Periodicals

• IEEE Trans. Reliability
• IEEE Design and Test
• IEEE Security & Privacy
• IEEE Trans. Software Engineering
• IEEE Trans. CAD
• IEEE Software
• IEE Proc. Software
• IEEE Micro
• IBM Journal of Development and Research
• IEEE Computer
• IEEE Trans. Computers
• IEE Proc. (Computers and Digital)
• Electronic Design
• Computer Design
• Proc. of IEEE
• Journal of Electronic Testing
• Others

Books

• Lyu: Handbook on Software Reliability Engineering, McGraw-Hill reviews
• Lala: Fault tolerant and Fault Testable Digital Design (Prentice hall) reviews
• Abramovichi, Breuer and Friedman: Digital Systems: Testing and Testable Design (CS Press) reviews
• Lala: Digital Circuit Testing and Testability reviews
• Bushnell and Agrawal: Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits reviews
• Rajsuman: Digital Hardware Testing (Artech House) reviews
• Jha and Gupta: Testing of Digital Systems reviews
• Malaiya and Rajsuman (Ed.):Bridging Faults and IDDQ Testing (IEEE CS Press) reviews
• Siewiorek and Swartz: The Theory and Practice of Reliable System Design reviews
• Malaiya and Srimani (Ed): Software Reliability Models (IEEE CS Press) reviews
• Musa: Software Reliability Engineering (McGraw Hill) reviews
• Musa, Ianino and Okumoto: Software Reliability (McGraw Hill) reviews
• Johnson: Design and Analysis of Fault Tolerant Digital Systems (Addison Wesley) reviews
• Shooman: Reliability of Computer Systems and Networks reviews
• Leveson: Safeware : System Safety and Computers reviews
• Jalote: Fault Tolerance in Distributed Systems reviews
• Pradhan (Ed): Fault Tolerant Computing (2 volumes) reviews
• Trivedi: Probability and Statistics with Reliability, Queueing, and Computer Science Applications reviews
• Fenton and Littlewood: Software Reliability and Metrics reviews
• Pullam: Software Fault Tolerance Techniques and Implementation reviews
• Singapurwall et al.:Statistical Methods in Software Engineering reviews
• Storey: Safety Critical Computer Systems reviews
• Neufelder: Ensuring Software Reliability reviews
• Nelson and Carroll (Ed): Tutorial: Fault Tolerant Computing (IEEE CS Press)
• Agrawal and Seth (Ed): Tutorial: Test Generation for VLSI Chips (IEEE CS Press)
• Shooman: Probabilistic Reliability (McGraw-Hill) reviews
• Beizer: Software Testing Techniques (Van Nostrand) reviews
• Bardell et al: Built-in test for VLSI (Wiley) reviews
• Dhillon: Reliability in Computer System Design (Ablex)
• Friedman and Menon: Fault-Diagnosis in Digital Systems
• Pierce: Failure Tolerant Computer Design (ancient!)
• Chang, Manning and Metze: Fault-diagnosis of digital systems
• Anderson and Lee: Fault-tolerance principles and practices
• Kraft and Toy: Microprogrammed control and reliable design

CSU Library

• SAGE -- online public access catalog
• Fault Tolerance: Vendor Reports Bitpipe