The continuing research is focussed on developing techniques for achieving and evaluating high security and reliability in computational systems.

Faculty

• Yashwant K. Malaiya, Professor

Faculty Collaborators

• Indrajit Ray, CS Dept.

• Indrakshi Ray, CS Dept.

• Anura Jayasumana, ECE Dept.

Selected Publications

• J.A. Scheibmeir and Y. K. Malaiya, "Social Media Perspectives on Digital Twins and the Digital Twins Maturity Model, Chapter in Digital Twins: Basics and Applications, Eds. Zhihan Lv and Elena Fersman, Springer, 2022, pp. 73-99.
• 1. J.A. Scheibmeir and Y. K. Malaiya, “A Social Media-driven Digital Twin of an Invasive Species,” Proceedings of the 10th Int. Work. on Simulation for Energy, Sustainable Development & Environment (SESDE 2022), Sept. 2022
• J. Scheibmeir, Y. Malaiya “Social media analytics of the Internet of Things,” Discover Internet of Things, July 19, 2021, pp. 1-16.
• A. M. Algarni, V. Thayananthan and Y. K. Malaiya “Quantitative Assessment of Cybersecurity Risks for Mitigating Data Breaches in Business Systems” Appl. Sci, 19 April 2021, 11, 3678, pp. 1-24.
• J. Scheibmeir, Y. Malaiya “Contextualization of the Augmented Reality Quality Model through Social Media Analytics,” Advances in Science, Technology and Engineering Systems Journal, vol. 5, no. 4, pp. 184-191 (2020)
• J.A. Scheibmeir and Y. K. Malaiya, “Quality Model for Testing Augmented Reality Applications,” IEEE 10th Ann. Ubiquitous Computing, Electronics & Mobile Communication Conference (UEMCON), 2019.
• J.A. Scheibmeir and Y. K. Malaiya, “An API Development Model for Digital Twins,” IEEE 19th International Conference on Software Quality, Security and Security Companion, July 22-26, 2019.
• Y. K. Malaiya, "Assessing Software Reliability Enhancement Achievable through Testing", Recent Advancements in Software Reliability Assurance 2019, pp. 107-138.
• Y. K. Malaiya, "Software Reliability: A Quantitative Approach, in System Reliability Management Solutions and Technologies, CRC Press, 2018, pp. 221-252.
• P. Xiao, Y. Yin, B. Liu, B. Jiang, Y. K. Malaiya, "Adaptive Testing Based on Moment Estimation", IEEE Trans. on Systems, Man, and Cybernatics: Systems, Dec 2017
• R. Abdunabi, Y. K. Malaiya, "The Impact of Test Case Prioritization on Test Coverage versus Defects Found," Proc. Int. Conf. Software Eng. Research and Practice, July 2017, pp. 10-16.
• L. Liu, Y. Yin, Z. Zhang, Y.K. Malaiya, "Redundant Design in Interdependent Networks", PLOS ONE Vol. 11, October 20, 2016.
• H. Joh and Y.K. Malaiya, "Periodicity in Software Vulnerability Discovery, Patching and Exploitation",International Journal of Information Security, July 2016, pp 1-18.
• A. M. Algarni and Y.K. Malaiya, "A Consolidated Approach for Estimation of Data Security Breach Costs", 2nd Int. Conf. on Information Management (ICIM), London, 2016, pp. 26-39.
• A. Younis, Y. Malaiya and I. Ray, "Evaluating CVSS Base Score Using Vulnerability Rewards Programs",Proc. 31th Int. Information Security and Privacy Conference, IFIP SEC, Ghent, Belgium, 2016, pp. 62-75.
• O.H. Alhazmi and Y.K. Malaiya, "Discretization of Disaster Recovery Choices: A Survey of Tiers Schemes", Proc. 31st Int. Conf. on Comp. and Their Applications (CATA), 2016, pp. 201-206.
• A. Younis, Y. Malaiya, C. Anderson and I. Ray "To Fear or Not to Fear That is the Question: Code Characteristics of a Vulnerable Function with an Existing Exploit”, Proc. ACM Conf. on Data and Application Security and Privacy 2016, pp. 97-104.
• A. Younis, Y.K. Malaiya and I. Ray, "Assessing Vulnerability Exploitability Risk Using Software Proprieties", Software Quality Journal, March 2016, Volume 24, Issue 1, pp. 159-202
• A. Younis and Y.K. Malaiya, "Comparing and Evaluating CVSS Base Metrics and Microsoft Rating System", The 2015 IEEE Int. Conf. on Software Quality, Reliability and Security, pp. 252-261
• H. Joh, Y. K. Malaiya, "Modeling Skewness in Vulnerability Discovery", Quality and Reliability Engineering International,Vol. 30, Issue 8, pp. 1445–1459, Dec. 2014.
• O.H. Alhazmi and Y.K. Malaiya, "Are the Classical Disaster Recovery Tiers Still Applicable Today?”, Proc. Int. Symp. Software Reliability Eng. Work. (ISSREW), pp. 114-115, Nov. 2014.
• A. Younis, Y.K. Malaiya, "Using Software Structure to Predict Vulnerability Exploitation Potential," Int. Conf. on Software Security and Reliability-Companion (SERE-C), pp.13-18, June 30-July 2 2014.
• A. M. Algarni, Y. K. Malaiya,"Software Vulnerability Markets: Discoverers and Buyers," Int. Journal of Computer, Information Science and Engineering, Vol:8 No:3, 2014, pp. 71-81.
• A. A. Younis, Y. K. Malaiya, and I. Ray, "Using Attack Surface Entry Points and Reachability Analysis to Assess the Risk of Software Vulnerability Exploitability", Proc. 2014 IEEE 15th International Symposium on High-Assurance Systems Engineering (HASE 2014), Miami, January, 2014, pp. 1-8.
• A. M. Algarni, and Y. K. Malaiya, "Most Successful Vulnerability Discoverers: Motivation and Methods", Int. Conference on Security and Management (SAM 2013), Las Vegas, July 2013, pp. 3-9.
• O. H. Alhazmi and Y.K. Malaiya, “Evaluating Disaster Recovery Plans Using the Cloud”, Proc. Reliability and Maintainability Symposium (RAMS 2013), Orlando, January 2013, pp. 37-42.
• A. A. Younis and Y. K. Malaiya,"Relationship between Attack Surface and Vulnerability Density: A Case Study on Apache HTTP Server", ICOMP'12, 2012 Int. Conference on Internet Computing, July 2012, pp. 197-203.
• O. H. Alhazmi and Y.K. Malaiya, “Assessing Disaster Recovery Alternatives: On-site, Colocation or Cloud”, Proc. 23rd IEEE Int. Symposium on Software Reliability Engineering Workshop, 2012, pp. 19-20.
• H. Joh and Y. K. Malaiya, "Defining and Assessing Quantitative Security Risk Measures Using Vulnerability Lifecycle and CVSS Metrics,'' SAM'11, The 2011 International Conference on Security and Management, pp.10-16, 2011
• A. A. Younis, H. Joh, and Y. K. Malaiya, "Modeling Learningless Vulnerability Discovery using a Folded Distribution,'' SAM'11, The 2011 International Conference on Security and Management, pp. 617-623, 2011
• S.-W. Woo, H. Joh, O. H. Alhazmi and Y. K. Malaiya, "Modeling Vulnerability Discovery Process in Apache and IIS HTTP Servers", Computers & Security,  January 2011, Pages 50-62.
• Y. K. Malaiya, "Optimal Reliability Allocation," Wiley Encyclopedia of Operations research and Management Science, John Wiley & Sons, Jan. 14, 2011.
• HyunChul Joh and Yashwant K. Malaiya, "A Framework for Software Security Risk Evaluation using the Vulnerability Lifecycle and CVSS Metrics" Proc. International Workshop on Risk and Trust in Extended Enterprises (RTEE’2010), November 2010, pp. 430-434.
• X. He, Y. K. Malaiya, A. P. Jayasumana, K. P. Parker and S. Hird, "Principal Component Analysis-Based Compensation for Measurement Errors Due to Mechanical Misalignments in PCB Testing" Proc. 41st International Test Conference (ITC'10), Austin, Texas, November 2010.
• H. Joh and Y. K. Malaiya, "Modeling Skewness in Data with S-shaped Vulnerability Discovery Models" Proc. Int. Symp. Software Reliability Eng. (ISSRE), FA,  November 2010, pp. 406-407.
• H. Joh, S. Chaichana and Y. K. Malaiya, "Short-term Periodicity in Security Vulnerability Activity"  Proc. Int. Symp. Software Reliability Eng. (ISSRE), FA,  November 2010, pp. 408-409 .
• A. P. Jayasumana, Y. K. Malaiya, X. He, K. P. Parker and S. Hird, "Compensation for measurment errors due to mechanical misalighment in PCB testing," IEEE 9th International Board Test Workshop (BTW'10), Fort Collins, CO, Sept. 2010.
• Y.K. Malaiya, "Software Reliability Management," Encyclopedia of Library and Information Sciences, Taylor and Francis, Editor: S. Lee, Third Edition, 1: 1, 4901 — 4912, February 2010.
• X. He, Y. K. Malaiya, A. P. Jayasumana, K. P. Parker and S. Hird, "An Outlier Detection Based Approach for PCB Testing,", Proc. IEEE Int. Test Conference, Nov. 2009, 10.3, pp. 1-10.
• X. He, Y. Malaiya, A. P. Jayasumana, K. P. Parker and S. Hird, "Outlier Detection in Capacitive Open Test Data Using Principal Component Analysis," Presented at the IEEE 8th International Board Test Workshop (BTW'09), Fort Collins, CO, Sept. 2009.
• H. Joh and Y. K. Malaiya, "Seasonal Variation in the Vulnerability Discovery Process, " Proc. 2nd IEEE Int. Conf. Software Testing, Verification, and Validation, April 2009, pp. 191-200.
• H. Joh and Y. K. Malaiya, "Seasonality in Vulnerability Discovery in Major Operating Systems and Web Applications," Fast Abstract, Proc. Int. Symp. Software Reliability Eng., Nov. 2008, pp. 297-298.
• H. Joh, J. Kim and Y. K. Malaiya, "Vulnerability Discovery Modeling using Weibull Distribution," Fast Abstract, Proc. Int. Symp. Software Reliability Eng., Nov. 2008, pp. 299-300.
• S.H. Wu, S. Jandhyala, Y. K. Malaiya, A. P. Jayasumana, "Antirandom Testing: A Distance Based Approach," VLSI Design, 2008.
• Y. K. Malaiya, "Reliability Allocation," Encyclopedia of Statistics in Quality and Reliability, John Wiley & Sons, March 2008.
• O. H. Alhazmi and Y. K. Malaiya, "Application of Vulnerability Discovery Models to Major Operating Systems," IEEE Trans. Reliability, March 2008, pp. 14-22.
• J. Kim, Y. K. Malaiya and I. Ray, "Vulnerability Discovery in Multi-Version Software Systems," Proc. 10th IEEE Int. Symp. on High Assurance System Engineering (HASE), Dallas, Nov. 2007, pp. 141-148.
• O. H. Alhazmi, Y. K. Malaiya , I. Ray, " Measuring, Analyzing and Predicting Security Vulnerabilities in Software Systems," Computers and Security Journal, Volume 26, Issue 3, May 2007, Pages 219-228.
• A. Sanyal, A. Sokolov, Y. Malaiya and D. Whitley, " A Co-evolutionary Algorithm for Dynamic Power Minimization During Scan Testing," 16th IEEE North Atlantic Test Workshop, May 2007, pp. 13-18.
• O. H. Alhazmi, " Assessing Vulnerabilities in Software Systems: A Quantitative Approach," Dissertation, CS Dept, Colorado State University, 2006.
• S-W. Woo, "An Analysis of Vulnerabilities in Web-servers and Browsers Using Time based and Effort-based Models," Thesis, CS Dept, Colorado State University, 2006.
• Jinyoo Kim, Omar Alhazmi and Yashwant Malaiya, "Vulnerabilities in Browsers: Trends in Internet Explorer and Firefox", Supp. Proc. Int. Symp. Software Reliability Eng., Fast Abstracts, Nov. 2006, pp 1-2.
• S-W. Woo, O.H. Alhazmi and Y.K. Malaiya, "An Analysis of the Vulnerability Discovery Process in Web Browsers", Proc. 10th IASTED Int. Conf. on Software Engineering and Applications, Nov. 2006.
• O.H. Alhazmi and Y.K. Malaiya, "Measuring and Enhancing Prediction Capabilities of Vulnerabilities Discovery Models for Apache and IIS HTTP Servers ", Proc. Int. Symp. Software Reliability Eng, Nov. 2006, pp. 343-352.
• O.H. Alhazmi, S-W. Woo, and Y.K. Malaiya, "Security Vulnerability Categories in Major Software Systems",  Proc. IASTED Int. Conference on Communication, Network and Information Security, Oct. 2006. pp.138-143.
• S-W. Woo, O.H. Alhazmi and Y.K. Malaiya, "Assessing Vulnerabilities in Apache and IIS HTTP Servers", Proc. IEEE Int. Symp. on Dependable, Autonomic and Secure Computing (DASC'06), Sept.-Oct. 2006, pp. 103-110.
• A. Sharma, A. P. Jayasumana and Y.K. Malaiya, "X-IDDQ: A Novel Defect Detection Technique using IDDQ Data," Proc. IEEE VLSI Test Symposium, April-May 2006, pp. 180-185.
• O. H. Alhazmi and Y. K. Malaiya, "Prediction Capabilities of Vulnerability Discovery Models," Proc. Reliability and Maintainability Symposium, Jan 2006, pp.86-91.
• Y. K. Malaiya, "Software Reliability and Security," Encyclopedia of Library and Information Science, 2005.
• Y. K. Malaiya, C. Braganza and C. Sutaria, "Early Applicability of the Coverage/Defect Model," Supp. Proc. Int. Symp. Software Reliability Eng, Nov. 2005, pp. 4.27-4.28.
• O. H. Alhazmi and Y. K. Malaiya, "Modeling the Vulnerability Discovery Process," Proc. Int. Symp. Software Reliability Eng, Nov. 2005, pp. 129-138.
• A. Sokolov, A. Sanyal, D. Whitley, Y.K. Malaiya, "Dynamic Power Minimization During Combinational Circuit Testing as a Traveling Salesman Problem", IEEE Congress on Evolutionary Computation, Sept. 2005, pp. 1088-1095.
• O. H. Alhazmi, Y. K. Malaiya and I. Ray, "Security Vulnerabilities in Software Systems: A Quantitative Perspective," Proc. IFIP WG 11.3 Working Conference on Data and Applications Security, 2005, August 2005, pp. 281-294
• A. S. Banthia, A. P. Jayasumana and Y. K. Malaiya, "Data Size Reduction for Clustering Based Binning of ICs Using Principal Component Analysis (PCA)", Proc. IEEE Int. Workshop on Defect Based Testing, May 2005.
• O. H. Alhazmi and Y. K. Malaiya, "Quantitative Vulnerability Assessment of Systems Software," Proc. Ann. IEEE Reliability and Maintainability Symp., 2005, pp. 615-620.
• J. Chen and Y.K. Malaiya, "Augmenting Test Case Geeneration using Statechart," Proc. Int. Conf. Software Eng. Research and Practice, June 2004, pp. 608-614.
• O. H. Alhazmi, Y. K. Malaiya , I. Ray, "Vulnerabilities in Major Operating Systems ," Technical Report, CS T&R, Colorado State University, 2004.
• Y.K. Malaiya, "Software Reliability," Encyclopedia of Library and Information Science, Marcel Dekker, May 2003, pp. 2688 - 2698.
• R. Turakhia, A. P. Jayasumana and Y. K. Malaiya, "Clustering-Based Production-Line Binning of ICs Based on IDDQ,'' Proc. IEEE International Workshop on Defect Based Testing, April 2003, pp. 65-73.
• D. Henry and Y.K. Malaiya, "A Visualization System for Sliding Windows Protocol," Proc. ACM/IEEE Frontiers in Education Conference, Nov. 2003, pp. T2C1-T2C6.
• Y.K. Malaiya, N. Li, J. Bieman, R. Karcich, "Software Test Coverage and Reliability," IEEE Trans. Reliability, Dec. 2002, pp. 420-426.
• H.V. Kantamneni, S.R.Pillai and Y.K. Malaiya "Structurally Guided Testing," in Supp. Proc. Int. Symp. Software Reliability Eng., Nov 2002, pp. 137-138.
• R.Ye and Y.K. Malaiya, "Relationship between test effectiveness and Coverage," in Supp. Proc. Int. Symp. Software Reliability Eng., Nov 2002, pp. 159-160.
• Y.K. Malaiya, "Kundalpur's Past Three Centuries," Arhat Vacan, Vol. 13, no. 3-4, 2001 pp. 5-13.
• S. Pillai, Issue in Automation of Checkpoint Encoding for Antirandom Testing, MS Thesis, Spring 2000.
• P. Rao, A.P Jayasumana and Y.K. Malaiya " Optimal Clustering and Statistical Identification of Defective ICs using IDDQ Testing," Proc. IEEE Int Work. on Defect Based Testing, April 2000, pp. 30-35.
• Y. K. Malaiya and J. Denton " Module Size Distribution and Defect Density," Proc. IEEE International Symposium on Software Reliability Engineering, Oct. 2000, pp. 62-71.
• Y. K. Malaiya and J. Denton "Requirement Volatility and Defect Density," Proc. IEEE Int. Symp. Software Reliability Engineering, Nov. 1999, pp. 285-294.
• Y.K. Malaiya, "Automated Test Software", for Wiley Encyclopedia of Electrical and Electronics Engineering, Editor: J.G. Webster, Pub. John Wiley & Sons, Inc. 1999, pp. 135-141.
• Palaniswamy, A. Jayasumana Y. K. Malaiya, "A Neural Network based Approach for Testing Analog Circuits with Frequency Domain Classification and Time Domain Testing", Int. Work. on System Test Diagnosis, 1999.
• S.H. Wu, Y.K. Malaiya and A.P. Jayasumana, " Antirandom vs. Psuedorandom Testing" Proc. IEEE International Conference on Computer Design, Oct. 1998.
• M.N. Li, Y.K. Malaiya and J. Denton, " Estimating the Number Defects: A Simple and Intutive Approach" Proc. IEEE International Symposium on Software Reliability Engineering, Industrial Practices, November 1998, pp. 307-315.
• Y.K. Malaiya and J. Denton, " Estimating the Number of Residual Defects" Proc. IEEE High Assurance Systems Engineering Symposium (HASE '98), November 1998, pp. 98-105.
• S.M. Menon, Y.K. Malaiya, A.P. Jayasumana and C.Q Tong, "Operational and Test Performance in the Presence of Built-in Current Sensors," Int. Journal of VLSI Design, 1997, V. 5, No. 3, pp. 285-298.
• S.M. Menon, Y.K. Malaiya and A.P. Jayasumana, "ECL Storage Elements: Modeling of Faulty Behavior," IEEE Trans. Circuits & Systems-II, Nov. 1997, pp. 970-974.
• M. Menon, A. P. Jayasumana and Y. K. Malaiya, "BiCMOS Domino: A Novel High-Speed Dynamic BiCMOS Logic," Int. Journal of Electronics, 1997, V. 83, No. 2, pp. 177-189.
• Y. K. Malaiya and J. Denton, " What Do the Software Reliability Growth Model Parameters Represent?" Int. Symp. on Software Reliability Engineering, 1997. pp. 124-135.
• H. Yin, Z. Lebne-Dengel and Y. K. Malaiya, " Automatic Test Generation using Checkpoint Encoding and Antirandom Testing" Int. Symp. on Software Reliability Engineering, 1997, pp. 84-95. Best Paper Award.
• S.M. Menon, Y.K. Malaiya and A.P. Jayasumana, "Input Pattern Classification for Detection of Stuck-on and Bridging Faults Using IDDQ Testing in BiCMOS and CMOS Circuits," Proc. International Conference on VLSI Design, Jan.1997, pp. 545-546.
• N. Karunanithi, Y.K. Malaiya, Neural networks for software reliability engineering", M.R. Lyu (Ed.), Handbook of Software Reliability Engineering, McGraw-Hill, New York (1996), pp. 699–728
• S. M. Menon, A. P. Jayasumana and Y. K. Malaiya, "Input pattern classification for transistor level testing of bridging faults in BiCMOS circuits," Proc. IEEE 6th Great Lakes Symposium on VLSI, March 1996, pp. 214-219.
• N. Li and Y.K. Malaiya, " Fault Exposure Ratio: Estimation and Applications" Proc. IEEE Int. Symp. Software Reliability Engineering, 1996, pp. 372-381.
• Y.K. Malaiya, "Golapurva Anvaya: Eka Parichaya" (Hindi), in Golapurva Jain Samaj: Itihas evam Sarvekshana ed. Dr. Surendra K. Jain, Pub. Paras Research Inst., Sagar, 1996, pp. 32-44.
• S.M. Menon, A.P. Jayasumana and Y.K. Malaiya " Testable Design for BiCMOS Stuck-Open Fault Detection using Single Patterns" IEEE Journal of Solid State Circuits, Aug. 1995, pp. 855-863.
• R.V. Vogety, A.P. Jayasumana and Y.K. Malaiya, "Interconnection of FDDI-II Networks Through an ATM Backbone, An Analysis," Proc. 20th Conf. on Local Computer Networks, pp. 150-157, Oct. 1995.
• S.M. Menon, A.P. Jayasumana and Y.K. Malaiya, "Manifestation of Faults in Single and Double BJT BiCMOS Logic Gates," Proc. IEE, Pt. E, Computers and Digital Techniques, Vol. 142, No. 2, pp. 135-144, March 1995.
• S. M. Menon, A. P. Jayasumana and Y. K. Malaiya, "A Novel High-Speed BiCMOS Domino Logic Family," Proc. of the 1995 IEEE Intl. Symp. on Circuits and Systems (ISCAS), pp. 21-24, May 1995.
• W.K. Al-Assadi, A.P. Jayasumana, Y.K. Malaiya, " A Bipartite Differential IDDQ Testable Static RAM Design" Proc. Int. Workshop on Memory Tech. Design and Testing, pp. 36-41, August 1995.
• W.K. Al-Assadi, Y.K. Malaiya and A.P. Jayasumana,, "Differential IDDQ Testable Static RAM Architecture" Proc. IEEE Int. Work. on IDDQ Testing, pp. 54-59, Oct. 1995.
• Yashwant K. Malaiya " Antirandom Testing: Getting the Most out of Black Box Testing" Proc. IEEE Int. Symp. on Software Reliability Engineering, pp. 86-95, Oct. 1995.
• N. Li and Y.K. Malaiya " ROBUST: A Next Generation Software Reliability Engineering Tool" Proc. IEEE Int. Symp. on Software Reliability Engineering, pp. 375-380, Oct. 1995.
• Y.K. Malaiya, A.P. Jayasumana, Q. Tong and S. Menon, "Resolution Enhancement in IDDQ testing for Large ICs" International Journal of VLSI Design, Vol. 1, No. 4, pp. 277-284.
• Y.K. Malaiya, "Golahivai and Golladeshadhipa" Arhat-Vachan, 1994 (in Hindi).
• W.K. Al-Assadi, D. Lu, A.P. Jayasumana, Y.K. Malaiya and C.Q. Tong, " Data Feed-through Faults in circuits using Unclocked Storage Elements," Electronic Letters, Vol. 30, No. 10, May 12, 1994, pp. 764-765.
• W.K. Al-Assadi, A.P. Jayasumana, Y.K. Malaiya, "On Fault Modeling and Testing of Content Addressable Memories," Proc. Int. Memory Tech. Design and Test Workshop, Aug. 1994. pp. 78-83.
• N. Li and Y.K. Malaiya, "On Input Profile Selection for Software Testing," Proc. Int. Symp. Software Reliability Engineering, Nov. 1994, pp. 196-205.
• Y.K. Malaiya, N. Li, J. Bieman, R. Karcich and B. Skibbe, " The Relationship between Test Coverage and Reliability" Proc. Int. Symp. Software Reliability Engineering, Nov. 1994, pp.186-195.
• Y.K. Malaiya and N. Li, "Software Reliability Modelling Approaches: Current Status," Proc. Int. Symp. Young Investigators on Information/Computer/Control, Beijing, Jan. 1994.
• S.M. Menon, Y.K. Malaiya and A.P. Jayasumana, C.Q Tong, "The Effect of Built-in Current Sensors (BICS) on Operational and Test Performance," Proc. VLSI Design, Jan. 1994, pp.187-190.
• S.M. Menon, A.P. Jayasumana and Y.K. Malaiya, "Input pattern Classification for Transistor Level Testing of BiCMOS Circuits" Proc. IEEE VLSI Test Symposium, 1994, pp. 457-462.
• Y.K. Malaiya, A. von Mayrhauser and P. Srimani, " An Examination of Fault Exposure Ratio," IEEE Trans. Software Engineering, Nov. 1993, pp. 1087-1094.
• S.M. Menon, Y.K. Malaiya and A.P. Jayasumana, "Testable Design of BiCMOS Circuits for Stuck-Open Fault Detection using Single Patterns" VLSI Test Symposium, April 1993, pp. 296-302.
• S.M. Menon, Y.K. Malaiya and A.P. Jayasumana, "Bridging Faults in BiCMOS Circuits," Proc. 5th NASA Symp. on VLSI Design, Nov. 1993, pp. 7.1.1-7.1.10.
• S.M. Menon, A.P. Jayasumana, Y.K. Malaiya and D.R. Clinkinbeard, "Modeling and Analysis of Bridging Faults in Emitter-Coupled Logic (ECL) Circuits," IEE Proceedings, Computer and Digital Techniques, Vol. 140, No. 4, July 1993, pp. 220-226.
• S.M. Menon, A.P. Jayasumana and Y.K. Malaiya "Test generation for BiCMOS Circuits," ISCAS, May 1993, pp. 1714-1717.
• W. Alassadi, Y.K. Malaiya and A.P. Jayasumana, " Faulty Behavior of Storage Elements and its Effects on Sequential Circuits" IEEE Trans. VLSI Systems, Dec. 1993 pp. 446-452.
• N. Li and Y.K. Malaiya, " Enhancing Accuracy of Software reliability Prediction" Proc. IEEE Int. Symp. on Software Reliability Engineering, Nov. 1993, pp. 71-79.
• K. Wu and Y.K. Malaiya, " A Correlated Faults Model for Software Reliability," Proc. IEEE Int. Symp. on Software Reliability Engineering, Nov. 1993, pp. 80-89.
• A von Mayrhauser, Y.K. Malaiya, P.K. Srimani and J. Keables, "On the Need for Simulation for Better Characterization of Software Reliability," IEEE Int. Symp. on Software Reliability Engineering, November 1993, pp. 264-273.
• S. M. Menon, Y. K. Malaiya and Anura P. Jayasumana, "Faulty behavior of ECL Storage Elements," Proc. IEEE Int. Workshop on Memory Testing, August 1993, pp. 31-36.
• W.K. Alassadi, Y.K. Malaiya and A.P. Jayasumana, " Modeling of Intra-Cell Defects in CMOS SRAM" Proc. IEEE Int. Workshop on Memory Testing, August 1993, pp. 78-81.
• W.K. Alassadi, Ding Lu, A.P. Jayasumana, Y.K. Malaiya and C. Tong, "Faulty Behavior of Asynchronous Storage Elements" Proc. 5th NASA Symp. on VLSI Design, Nov. 1993, pp. 7.4.1-7.4.9.
• S.M. Menon, Y.K. Malaiya, A.P. Jayasumana and C.Q Tong, " Limitations of Built-in Current Sensors (BICS) for IDDQ Testing," IEEE Asian Test Symposium '93, Nov. 1993, pp. 243-248.
• N. Li and Y.K. Malaiya, "Fault Exposure Ratio and Reliability Estimation" Proc. Third Workshop on Issues in Software Reliability, Nov. 1993, pp. 6.3.1-6.3.18.
• W. Alassadi, Y.K. Malaiya and A.P. Jayasumana, "Use of Storage Elements as Primitives for Testing Sequential Circuits," Proc. 6th Int. Conf. on VLSI Design, Jan. 1993, pp. 118-123.
• Y.K. Malaiya, "The Sravakas of Madanasagarpura in the Chandel Period" Anekanta, July-Sept. 1993 (in Hindi).
• N. Karunanithi, D. Whitley and Y.K. Malaiya, "Prediction of Software Reliability using a Connectionist Approach," IEEE Trans. Software Engineering, Sept. 1992, pp. 563-574.
• Y.K. Malaiya, N. Karunanithi and P. Verma, " Predictability of Software Reliability Models," IEEE Trans. Reliability, Dec. 1992, pp. 539-546.
• N. Karunanithi and Y.K. Malaiya, "The Scaling Problem for Neural Networks for Software Reliability Prediction" Proc. IEEE Int. Symp. Soft. Rel. Eng., Oct. 1992, pp. 76-82.
• N. Karunanithi, D. Whitley and Y.K. Malaiya, " Applying Neural Networks to Software Reliability Prediction," IEEE Software, July 1992, pp. 53-59.
• S.M. Menon, Y.K. Malaiya and A.P. Jayasumana, " Single BJT BiCMOS Behavior under Stuck and Bridging Faults," IEEE VLSI Test Symposium, April 1992, pp. 315-320.
• W. Alassadi, Y.K. Malaiya and A.P. Jayasumana, "Detection of Feed-Through Faults in CMOS Storage Elements," Proc. 4th NASA Symp. on VLSI Design, 1992, pp. 7.2.1-7.2.5.
• A.K. Anantrao, A.P. Jayasumana and Y.K. Malaiya, "Performance of T1 as an Interconnect of Ethernets Carrying Voice and Data Traffic," to appear in Proc. 26th Ann. Asilomar Conf. on Sig., Sys. and Comp..
• S.M. Menon, Y.K. Malaiya and A.P. Jayasumana, "On Bridging Faults in ECL Circuits," Proc. 5th Int. Conf. on VLSI Design, 1992, pp. 55-60.
• S.M. Menon, Y.K. Malaiya and A.P. Jayasumana, "Behavior of Faulty Double BJT BiCMOS Logic Gates," Proc. 4th NASA Symposium on VLSI Design, 1992, pp. 8.4.1-8.4.12.
• Y.K. Malaiya, A. von Mayrhauser and P. Srimani, "The Nature of Fault Exposure Ratio," Proc. IEEE Int. Symp. Soft. Rel. Eng., Oct. 1992, pp. 23-32.
• Y.K. Malaiya, A. von Mayrhauser and P. Srimani, "The Constant Per-Fault Hazard Rate Assumption," Proc. 2nd Work. Issues in Soft. Rel. Est., Oct. 1992, pp. 1-5.
• Y. Min, Y.K. Malaiya and B. Jin, " Analysis of Detection Capability of Parallel Signature Analyzers," IEEE Trans. Computers, Vol. 40, No. 9, Sept. 1991, pp. 1075-1081.
• A.P. Jayasumana and Y.K. Malaiya and R. Rajsuman, " Design of CMOS Circuits for Stuck-Open Fault Testability," IEEE Journal of Solid State Circuits, Vol. 26, No.1, January 1991, pp. 58-61.
• Y.K. Malaiya, A.P. Jayasumana, Q. Tong and S. Menon, "Enhancement of Resolution in Supply Current based Testing for Large ICs" Proc. IEEE VLSI Test Symposium, April 1991, pp. 291-296.
• S.M. Menon, Y.K. Malaiya and A.P. Jayasumana, "Fault Modeling and Testable Design of 2-level Complex ECL Gates," Proc. Fourth CSI/IEEE Int. Symp. on VLSI Design, Jan. 1991, pp. 23-28.
• N. Karunanithi, Y.K. Malaiya and D. Whitley, "Prediction of Software Reliability Using Neural Networks," Proc. Int. Symp. on Software Reliability Engineering, May 1991, pp. 124-130.
• S. Feng and Y.K. Malaiya, "Evaluation of Detectability in BIST Environment," Proc. IEEE VLSI Test Symposium, April 1991, pp. 271-276.
• R. Rajsuman, A.P. Jayasumana and Y.K. Malaiya, "An Analysis and Testing of Operation Induced Faults in MOS VLSI," Proc. VLSI Test Symposium, April 1991, pp. 137-142.
• A.P. Jayasumana, W. Al-assadi and Y.K. Malaiya, "On Pass Transistor Logic Design," International Journal of Electronics, Vol. 70, No. 4, April 1991, pp. 739-749.
• S. Feng and Y.K. Malaiya, "Optimization of Test Parallelism with Limited Hardware Overhead," Microelectronics and Reliability, Vol. 31, No. 2, 1991, pp. 271-276.
• Y.K. Malaiya, "Early Characterization of the Defect Removal Process," Proc. 9th Annual IEEE Software Reliability Symposium, May 1991, pp. 6.1-6.4
• J. Bieman, Y.K. Malaiya, K. Olender, R. Oldehoeft and P. Srimani, "The Reliable Software Laboratory at Colorado State University" Proc. 9th Annual IEEE Software Reliability Symposium, May 1991, pp. 6.5-6.10.
• Y.K. Malaiya and P.K. Srimani, "An Introduction to Software Reliability Models," Proc. CMG -91, December 1991, pp. 1237-1239.
• Y.K. Malaiya, "The Sravakas of Golladesh and Gollapura," Anekanta, Vol. 44, No. 1, Jan. 1991, pp. 4-8 (in Hindi).
• Y.K. Malaiya, N. Karunanithi and P. Verma, "Predictability Measures For Software Reliability Models", Proc. IEEE Computer Software and Applications Conference (COMPSAC 90), Oct. 1990, pp. 7-12.
• Y. Min, Y.K. Malaiya and B. Jin, "Aliasing errors in parallel signature analyzers," Journal of Computer Science and Technology, V. 5, No. 1, January 1990, pp. 25-40.
• S.M. Menon, A.P. Jayasumana and Y.K. Malaiya, "Gate Level Modeling of ECL Circuits," Proc. First Great Lakes Symposium on VLSI, March 1991, pp. 330-331.
• Y.K. Malaiya, S. Sur, N. Karunanithi and Y.C. Sun, "Implementation Considerations for Software Reliability," Software Reliability Symposium, June 1990, pp. 6.21-6.30.
• Y.K. Malaiya, "Identification of Golladesh and Gollacharya on the basis of Kuvalayamala-kaha," in Jaganmohanlal Shastri Felicitation Volume, JML Sadhuvad Samiti, 1990 (in Hindi) pp. 448-454*.
• Y.K. Malaiya, "Golapurva Jati ke Pariprekshya men" in Vyakaranacharya Banshidhar Felicitation Volume, 1989 (in Hindi), pp. 103-130.
• S.M. Menon, A.P. Jayasumana and Y.K. Malaiya, "Fault Modeling for ECL Devices," Electronic Letters, Vol. 26, N0. 15, July 19, 1990, pp. 1105-1108.
• R. Rajsuman, Y.K. Malaiya and A.P. Jayasumana, "A New Testable Design of Field Programmable Logic Array," Proc. IEEE Int. Symp. on Circuits and Systems, 1990, pp. 436-439.
• R. Rajsuman, Y.K.Malaiya and A.P. Jayasumana, "Reprogrammable FPLA with Universal Test Set," Proc. IEE, Vol. 137, Pt. E, No. 6, Nov. 1990, pp 437-441.
• S. Hwang, R. Rajsuman and Y.K. Malaiya, "On the Testing of the Microprogrammed Processor," Proc. 23rd Int. Symp. and Work. on Microprogramming and Microarchitecture, Nov. 1990, pp. 260-266..
• A.P. Jayasumana, W. Al-assadi and Y.K. Malaiya, "Pass Transistor Logic Design," in VLSI System Design, Editors: L.M. Patnaik and A.D. Singh, (Proc. Third International Workshop on VLSI Design ), Tata-McGraw-Hill, Jan. 1990, pp. 13-17.
• R. Rajsuman, Y.K. Malaiya and A.P. Jayasumana, " Limitations of Switch Level Analysis for Bridging Faults," IEEE Trans. CAD., Vol. 8, No. 7, July 1989, pp. 807-811..
• R. Rajsuman, A.P. Jayasumana and Y.K. Malaiya, "CMOS Stuck-open Fault Detection in Presence of Glitches and Timing Skews," IEEE Journal of Solid State Circuits, Vol. 24, No. 4, August 1989, pp. 1055-1061.
• R. Rajsuman, Y.K. Malaiya and A.P. Jayasumana, " CMOS Stuck-open Fault Testability," IEEE Journal of Solid State Circuits, Vol. 24, No. 1, pp. 193-194, Feb. 1989.
• R. Rajsuman, Y. K. Malaiya, and A. P. Jayasumana, "On accuracy of switch-level modeling of bridging faults in complex gates. Proc. 24th ACM/IEEE Design Automation Conference (DAC '87), pp. 244-250.
• Y.K. Malaiya, Ramesh Narayanaswamy,"Modeling and Testing for Timing Faults in Synchronous Sequential Circuits," Design & Test of Computers, IEEE , vol.1, no.4, Nov. 1984, pp.62-74.
• Y.K. Malaiya and S. Yang, ""The Coverage Problem for Random Testing"Proc. International Test Conference, October 1984, pp. 237-245.
• Y.K. Malaiya, "Linearly Correlated Intermittent Failures," IEEE Trans. Reliability, vol. R-31, no. 2, pp. 211 - 215, June 1982.
• Y.K. Malaiya and S. Y. H. Su, "Analysis of an Important Class of Non-Markov Systems," IEEE Transactions on Reliability, vol. R-31, no. 1, pp. 64-68, April 1982.
• Yashwant K. Malaiya, Stephen Y. H. Su, "A New Fault Model and Testing Technique for CMOS Devices", Proc. Int. Test Conference, Nov. 1982, pp.25-34
• C-C. Liaw, S. Y. Su, and Y. K. Malaiya. "Test generation for delay faults using stuck-at-fault test set." Proc. of International Test Conf. 1980, pp. 167-175.
• Su, S.Y.H.; Koren, I.; Malaiya, Y.K., "A Continuous-Parameter Markov Model and Detection Procedures for Intermittent Faults," Computers, IEEE Transactions on , vol.C-27, no.6, pp.567,570, June 1978.

Patents

• Patent:5757816 : IDDQ testing of integrated circuits

• Is Internet Explorer More Secure than Firefox?, Kate Green, MIT Techology review, Sept. 21, 2006.
• Software Flaws Can Be Predicted, David Utter, SecurityProNews, July 3, 2006.
• Modell zur Vorhersage von Sicherheitslucken, von Frank Ziemann, PCWelt, July 4, 2006
• Researchers look to predict software flaws, Robert Lemos, July 10, 2006, also at SecurityFocus, July 7, 2006.
• CSU team crushes computer bugs, Christine McManus, Coloradoan, July 10, 2006.
• Un progetto di ricerca per prevedere il numero di errori nel software, Paolo De Nictolis,13-07-2006.

Tools

• ROBUST: An Integrated Software Reliability Tool

Events

• IEEE Int. Symp. Software Reliability Eng.
• IEEE International Workshop on Defect-based Testing
• C